Dan Stieler
Dan Stieler is an Iowa State graduate (BS, EE, 2004) who is working towards his M.S. in EE with Professor Dalal. His research deals with measurement of structural and electronic properties of nanocrystaline Si grown using a remote hot wire growth process. Dan has developed a novel technique for measuring mobility in nanocrystalline materials, using space charge limited curent techniques. Unlike the measurement of Hall mobility, which relies on transverse transport on films grown on glass substrates, this technique gives information about vertical transport in device-like structures. The technique is yielding very useful information about mobility as a function of grain size and temperature, and will become a routine tool in Professor Dalal’s group for measuring majority carrier transport properties in nanocrystalline materials.
Back to Current Graduate Students